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第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
 
QT-8600RF Mixed Signal RF Test System

RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test



Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model QT-8600RF Mixed Signal RF Test System
Product Advantages RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
Key Features ? DC, digital, RF integrated machine
? 16 RF ports (8 in & 8 out)
? 6Ghz RF measurement circuit, power can be configured to 48dBm
? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones
? Supports vector and scalar testing
? Digital meets MIPI 50Mhz or above test
? Supports 2-station RF parallel testing and multi-station composite testing
? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices.




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