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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
首頁 產(chǎn)品中心 Test System Power module and device testing system
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QT-8409PIM high-power dynamic and static comprehensive test system

QT-8409PIM power module dynamic and static test system Applied to IGBT/SIC power module DC/AC dynamic and static parameter test, support high temperature/normal temperature, mass production/manual test, automatic/semi-automatic application scenarios



High-speed short-circuit protection

Low stray

Flexible tooling

Suitable for mass production/manual test

Type
 QT-8409PIM
Advantages Industry leading short circuit protection speed, effective protection of Socket, low stray solution
Quickly change different tooling
Main Features ? Support 4 stations
? ISC 12KA LS<30nH
? AC：SW、 TRR 、ISC、QG、RBSOA test
? AC@3000A 1500V
? DC@2000A 2KV /3KV/6KV/8KV
? Protect Clamp<2us
? Test object：PIM IGBT module, SiC module, DBC, three level products, etc

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