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第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
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QT-3101 UIL avalanche test

QT-3101 UIL avalanche test is suitable for testing avalanche parameters of MOSFETs, IGBTs and diodes



Support double DIE

Fast charging

Save failure waveform

Clamp voltage function

Type QT-3101 UIL
Advantages ? Support VDD ON(E=1/2L*I*I*BVDSS/(BVDSS-VDD)) or VDD OFF(E=1/2*L*I*I) test
? Can share a computer with QT-4100B to achieve unified management of test programs and data
? Single pulse, multi-pulse or dual MOSFET testing can be set
? Real-time measurement monitors, output current, IDMAX, and Energy readouts
? The internal resistance of the inductor is low, the ID charging is fast, and the test time is shorter
? Built-in oscilloscope
Main Features ? Output measurement capability: Maximum measurement BVdss: ±3000V Maximum output ID: ±150V, ±200A
? Editable VG MAX: ±30V pulse width adjustment (resolution: 1us)
? Programmable inductor box load 10μH-159.9mH step 10μH
? 24 programmable sorting machine interface signals

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