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第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
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QT-3102 thermal resistance tester

QT-3102-XX test device type: triode, field effect tube, IGBT, diode



Support double DIE

1000W thermal resistance

Overload and undervoltage protection



Type QT-3102
Advantages QT-3102-XX test device type: triode, field effect tube, IGBT, diode
R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
R26：Dual Die testing can be implemented through scanbox
Main Features ? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
? The maximum voltages are 100V and 200V respectively





Testing standards檢測標(biāo)準(zhǔn)
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