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第三代
半導體測試家族
Third generation semiconductor testing family
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QT-3105 TRR diode reverse recovery test

Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF



Independent programmable power supply

Support double DIE

Dual channel test

Waveform display

Type QT-3105TRR
Advantages Supports dual-core TRR parameter testing, equipped with VRR voltage probe
Main Features ? Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns

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