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第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
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QT-3107 LCR RG/CG test

Self-developed LCR digital bridge supports Mosfet RG/CG testing and can also be used to test the capacitance of diodes with a resolution of 1fF.



Support double DIE

High precision and anti-interference

Fast testing

Extended 2KV bias

Model QT-3107
Product Advantages Using digital bridge, it has strong anti-interference ability and high test accuracy;
The test time is 2-3 times faster than the analog bridge;
Bias voltage up to 2KV;
Key Features Test resolution 1fF;
Self-equipped with ±100V bias source;
Test frequency: 1MHz, extended to 2MHz;
Output amplitude: 0.025-2V;




Testing standards檢測標(biāo)準(zhǔn)
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