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第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
首頁 產(chǎn)品中心 Test System Power Device Testing System
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KGD (Know Good Die) testing solution

Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;



Pin card 

protection

  

Two-DUT test in parallel

High temperature and 

normal temperature

Data merge

Model KGD testing solutions
Product Advantages ? Low spurious solutions;
? Exclusive pin card protection patented technology;
? Overload and undervoltage protection;
? Test two wafers at a time;
? Supports high temperature heating




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